ASTM E996-10(2018) - 1.11.2018
 
Significance and Use

5.1 Include the experimental conditions under which spectra are taken in the “Experiment” section of all reports and publications.

5.2 Identify any parameters that are changed between different spectra in the “Experiment” section of publications and reports, and include the specific parameters applicable to each spectrum in the figure caption.

 
1. Scope

1.1 Auger and X-ray photoelectron spectra are obtained using a variety of excitation methods, analyzers, signal processing, and digitizing techniques.

1.2 This practice lists the desirable information that shall be reported to fully describe the experimental conditions, specimen conditions, data recording procedures, and data transformation processes.

1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

1.5 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

 
2. Referenced Documents

E673-03

Standard Terminology Relating to Surface Analysis (Withdrawn 2012)

E1127-08(2015)

Standard Guide for Depth Profiling in Auger Electron Spectroscopy

E902-05

Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers (Withdrawn 2011)

E1078-14(2020)

Standard Guide for Specimen Preparation and Mounting in Surface Analysis

E983-19

Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy

E995-16

Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy