ASTM F1996-06 - 1.7.2006
 
Significance and Use

The effects of silver migration are short circuiting or reduction in insulation resistance. It is evidenced by staining or dicoloration between the cathode and anode conductive traces.

Accelerated testing may be accomplished by increasing the voltage over the specified voltages. (A typical starting point would be 5Vdc 50mA).

 
1. Scope

1.1 This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.

1.2 Silver migration will occur when special conditions of moisture and electrical energy are present.

 
2. Referenced Documents

F1596-15

Standard Test Method for Exposure of a Membrane Switch or Printed Electronic Device to Temperature and Relative Humidity (Withdrawn 2024)

F1689-05

Standard Test Method for Determining the Insulation Resistance of a Membrane Switch