ASTM E995-97 - 10.2.1997
 
1. Scope

1.1 The purpose of this guide is to familiarize the analyst with the principal background subtraction techniques presently in use together with the nature of their application to data acquisition and manipulation.

1.2 This guide is intended to apply to background subtraction in electron, X-ray, and ion-excited Auger electron spectroscopy (AES), and X-ray photoelectron spectroscopy (XPS).

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

 
2. Referenced Documents

E673-03

Standard Terminology Relating to Surface Analysis (Withdrawn 2012)

ISO 18115–1

Surface chemical analysisVocabularyPart 1: General terms and terms used in spectroscopy