5.1 This test method is used to evaluate the applicability of other ASTM test methods to a photovoltaic device.

5.2 The procedure described in this test method is intended to be used to determine the degree of linearity between the short-circuit current of a photovoltaic device and the irradiance level incident on the device. This test method can be used for other device parameters, provided the function passes through the origin.

1.1 This test method determines the degree of linearity of a photovoltaic device parameter with respect to a test parameter, for example, short-circuit current with respect to irradiance.

1.2 The linearity determined by this test method applies only at the time of testing, and implies no past or future performance level.

1.3 This test method applies only to non-concentrator terrestrial photovoltaic devices.

1.4 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

1.6 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.