ASTM E2142-01 - 10.4.2001
 
1. Scope

1.1 This test method covers procedures to obtain particle size distribution, chemical classification, and E45 ratings of inclusions in steels using an automated scanning electron microscope (SEM) with X-ray analysis and automatic image analysis capabilities.

1.2 There are three discrete methods described. Method 1 is the SEM analog of E1122, which uses image analysis and light microscopy to produce automated E45 ratings. Method 2 produces similar ratings based predominantly on sorting inclusions by chemistry into the traditional classes defined in E45. Method 3 is recommended when explicit detail is needed on particular inclusion types, not necessarily defined in E 45, such as to verify the composition of inclusions in inclusion-engineered steel. Method 3 reports stereological parameters such as volume or number fraction, rather than E45 type ratings.

1.3 This test method deals only with the recommended test methods and nothing in it should be construed as defining or establishing limits of acceptability for any grade of steel or other alloy where the method is appropriate.

1.4 The values stated in SI units are to be regarded as the standard. Values in parentheses are conversions and are approximate, and for information only.

1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

 
2. Referenced Documents

E3-11(2017)

Standard Guide for Preparation of Metallographic Specimens

E768-99(2018)

Standard Guide for Preparing and Evaluating Specimens for Automatic Inclusion Assessment of Steel

E766-14(2019)

Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

E45-18a(2023)

Standard Test Methods for Determining the Inclusion Content of Steel (Includes all amendments and changes 11/6/2023).

E1245-03(2023)

Standard Practice for Determining the Inclusion or Second-Phase Constituent Content of Metals by Automatic Image Analysis

ANSI/IEEE STD 759

IEEE Standard Test Procedure for Semiconductor X-Ray Energy Spectrometers Available from Institute of Electrical and Electronics Engineers, Inc. (IEEE), 445 Hoes Ln., P.O. Box 1331, Piscataway, NJ 08854-1331, http://www.ieee.org.

E7-22

Standard Terminology Relating to Metallography

E1508-12a(2019)

Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy (Includes all amendments and changes 11/19/2019).