ASTM E2444-05e1 - 1.5.2005
 
1. Scope

1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section , which were generated by Committee E08 on Fatigue and Fracture. Terminology E 1823 Relating to Fatigue and Fracture Testing is applicable to this standard.

1.2 The terms are listed in alphabetical order.

 
2. Referenced Documents

E2246-11

Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer

E1823-23

Standard Terminology Relating to Fatigue and Fracture Testing

E2244-11

Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer

E2245-11

Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer