ASTM E431-96(2002) - 10.12.1996
 
1. Scope

1.1 This guide provides illustrations of radiographs of semiconductors and related devices. Low powered transistors (through the TO-11 case configuration), diodes, low-power rectifiers, power devices, and integrated circuits are illustrated with common assembly features. Particular areas of construction are featured for these devices detailing critical points of design or assembly.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

 
2. Referenced Documents

E801-21

Standard Practice for Controlling Quality of Radiographic Examination of Electronic Devices

E1316-24

Standard Terminology for Nondestructive Examinations

E1255-23

Standard Practice for Radioscopy

E1161-21

Standard Practice for Radiographic Examination of Semiconductors and Electronic Components